| Titre : |
Electronic noise |
| Type de document : |
texte imprimé |
| Auteurs : |
András Ambrózy, Auteur |
| Editeur : |
New york, St louis, san francisco... : McGraw-Hill Company |
| Année de publication : |
1982 |
| Importance : |
281 p. |
| Présentation : |
ill. |
| Format : |
24 cm. |
| ISBN/ISSN/EAN : |
9780070011249 |
| Langues : |
Anglais (eng) |
| Catégories : |
AUTOMATISME
|
| Index. décimale : |
25-02 Théorie et traitement du signal |
| Résumé : |
The book is regarded as a fundamental text in the study of noise within solid-state devices. Its chapters cover:
Stochastic signals in time and frequency domains.
Physical aspects and types of electronic noise (such as flicker/1/f noise).
Noise parameters in linear networks and semiconductor devices.
Nonlinear transfer characteristics and noise measurement techniques. |
| Note de contenu : |
CONTENTS
2 distribution and density functions of instantaneous value .
3 stochastic signals in the time and frequency domain.
4 the physical aspects of noise .
5 noise parameters of linear networks.
6 noise of semiconductor devices .
7 effects of nonlinear characteristics .
8 noise measurements |
Electronic noise [texte imprimé] / András Ambrózy, Auteur . - New york, St louis, san francisco... : McGraw-Hill Company, 1982 . - 281 p. : ill. ; 24 cm. ISSN : 9780070011249 Langues : Anglais ( eng)
| Catégories : |
AUTOMATISME
|
| Index. décimale : |
25-02 Théorie et traitement du signal |
| Résumé : |
The book is regarded as a fundamental text in the study of noise within solid-state devices. Its chapters cover:
Stochastic signals in time and frequency domains.
Physical aspects and types of electronic noise (such as flicker/1/f noise).
Noise parameters in linear networks and semiconductor devices.
Nonlinear transfer characteristics and noise measurement techniques. |
| Note de contenu : |
CONTENTS
2 distribution and density functions of instantaneous value .
3 stochastic signals in the time and frequency domain.
4 the physical aspects of noise .
5 noise parameters of linear networks.
6 noise of semiconductor devices .
7 effects of nonlinear characteristics .
8 noise measurements |
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